Analysis of the correlation of topography of the 2D materials

The aim of the work is to develop a tool for correlative topography and kpfm analysis of 2D material surfaes in the form of a software package in any programming language (C, C++, Java, Matlab / Octave, Python,...) testing and also extensive description of properties of 2D materials I suggest you to collect this information in the table in which you group the properties (eg. optical, electrical, mechanical). You should also point out which of them can be determined on the basis of KPFM or CFM measurements. statements of selected 20 scientific papers (in the form of three sentences per paper). They would be combined, grouped and put in order in the final text. The order and structure of the introduction should be done in original way. This the reason why I suggest you to collect and group properties in the table. Look at the paper below. It is about impact of mechanical stress on electrical properties. This is what we would like to observe by correlation of AFM and KPFM or C-AFM images. Dig around this article (check citing and cited articles). Explain in the introduction why do you want to correlate these SPM images. Liping Yu*, Adrienn Ruzsinszky, and John P. Perdew, Bending Two-Dimensional Materials To Control Charge Localization and Fermi-Level Shift, NanoLetters 2016 Do some research on the surface properties (roughness, skewness, curtosis, and even more important mean slope and curvature). Think how to calculate them in a programming tool you want to use or even implement them because we are short in time.